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Validation of a new 64MHz RF exposure system for testing medical implants for RF-induced heating according to ASTM-F2182 and ISO/TS 10974
Finya Ketelsen1,2, Kevin Kröninger2, and Gregor Schaefers1,3
1MRI-STaR - Magnetic Resonance Institute for Safety, Technology and Research GmbH, Gelsenkirchen, Germany, 2TU Dortmund University, Dortmund, Germany, 3MR:comp GmbH, Testing Services for MR Safety & Compatibility, Gelsenkirchen, Germany
This study introduced the validation of a new RF field source for testing implants for RF-induced heating according to ASTM F2182 and ISO/TS 10974. Its ability to produce different homogeneous fields over a large area qualifies it for testing all kinds of active and passive implants.
Fig. 5: This figure shows the measured temperature rise values after six minutes divided by the square of the incident E-field at each position and the target values from Annex I1.
Fig. 4: This figure shows the measured Erms-field distributions, a) Erms-field at 0° phase, c) Erms-field at 180° phase and the deviation between measurement and simulation in b) 0°phase and d) 180° phase.